This article presents a radiation tolerant single-shot time-to-digital converter (TDC) with\na resolution of 15.6 ps, fabricated in a 65 nm complementary metal oxide semiconductor (CMOS)\ntechnology. The TDC is based on a multipath pseudo differential ring oscillator with reduced phase\ndelay, without the need for calibration or interpolation. The ring oscillator is placed inside a Phase\nLocked Loop (PLL) to compensate for Process, Voltage and Temperature (PVT) variations- and\nvariations due to ionizing radiation. Measurements to evaluate the performance of the TDC in terms\nof the total ionizing dose (TID) were done. Two different samples were irradiated up to a dose of\n2.2 MGy SiO2 while still maintaining a resolution of 15.6 ps. The TDC has a differential non-linearity\n(DNL) and integral non-linearity (INL) of 0.22 LSB rms and 0.34 LSB rms respectively.
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